XRF Products PDF Brochures

Matrix Metrologies, Inc. (Holbrook, NY), a supplier of film measurement equipment, has made available a set of eight new XRF technical brochures available in print or email (PDF) form. The set details Matrix Metrologies complete XRF film thickness and composition product line offering along with available technical training seminars and programs.

Detailed specifications and performance data are available on the following XRF measurement system platforms:

The INVOeco and ComPact eco are low cost universal X-ray analysis systems designed for coating thickness and material analysis measurement of flat and bulk samples, such as contacts, small PCB's, and metal parts of all kinds and liquids and powders. The Compact 5 and Maxxi 5 X-ray coating thickness measurement and material analysis systems are designed for the inspection of electronic components, PCB’s and other precision metal finishing applications for the metal finishing, microelectronics and semiconductor industries.

The HiSpeX and NanoMaster products are designed for the analysis of applications requiring superior detection capability such as demanding coating applications where films below 1000 angstroms (4 µin.) are employed and/or binary and ternary alloy stacks are required. The NanoMaster Product line offers a versatile MXRF tool platform designed for applications requiring variable beam geometry, enhanced detector speed, resolution and sensitivity, and maximum elemental range capability.

Visit www.matrixmetrologies.com

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