Applications > Test & Measurement

October 2006

• Raman Spectrometer System for Analytical Method Development Using SERS
• The Elzone II 5390 Particle-Size Analyzer
• Environmental Isolation System Optimizes Performance of Surface Imaging Tools
• Mexico's IMP Opens New Microscopy Center With FEI Tools
• Instrument Provides Chemical Imaging Solutions

September 2006

• High-Speed, High-Resolution Focus Control
• Compact Piezo XY-Tables for Nanopositioning Applications
• FIREFLY™ LM10 Nanoparticle Characterization System

August 2006

• Advanced Research Microscope
• Chemical Vapor Deposition Tool
• FEI’s Titan™ S/TEM Achieves Low kV Milestone

July 2006

• Instrument Probes Nanostructure Growth for Industry and Research


• Molecular Modeling Software
• Nanotechology Applications Open Up to High-Performance DLS System

June 2006

• Nanometer Design Timing Analysis Technology

May 2006

• Model 2182A Nanovoltmeter


• Dynamic Light Scattering Instrument

April 2006

• Computer Model Maps Strengths, Weaknesses of Nanotubes


• New Measurements Prove Myosin VI Can Act as Molecular Transporter

March 2006

• Single-Beam FIB for Automated, Precise Milling of Specimens


• New Analytical Instrument and Nano-Probe Products


• Agilent Technologies 93000 Series and 4073 Parametric Testers Selected for Nanotechnology Joint Development Program

February 2006

• Micro Photonics Launches the Nanovea Series of Materials Research Instruments


• FEI Introduces New Cryo Sample Prep Tool for Organic Samples


• Contamination-Resistant Grid Encoder

December 2005

• Bringing a New Focus to Nanotech

October 2005

• Maskless Lithography System
  
• High-Performance Nanoscale Metrology System

September 2005

• Nanopositioning Stages Grow Smaller
  
• Molecular Imprints Installs Tools In Various National Labs & Research Centers

August 2005

• Extreme Ultraviolet (EUV) Lithography

May 2005

• 6-D Nanopositioning System

February 2005

• Ultra-Low-Profile Microscopy Stage