Nanotech Briefs

NANOSENSORS™ Q30K-Plus Silicon AFM probes for Non-Contact Mode and Force Modulation Mode

The new NANOSENSORS™ (Neuchatel, Switzerland) Q30K-Plus AFM tip with a very high Q-factor and an enhanced signal to noise ratio for UHV applications is now available.

Based on the well-known PointProbe® Plus AFM probe NANOSENSORS™ has developed the Q30K-Plus SPM-probe series especially for UHV applications. For high sensitivity and a good signal to noise ratio the new probes are featuring a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800 nm).

Q30K-Plus scanning proximity probe with a very high Q-factor and an enhanced signal to noise ratio for UHV applications.

In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7 nm.

The Q30K-Plus™ AFM probe will be available in the following types and package sizes:

PPP-QNCHR for Non-Contact Mode/Tapping Mode™:

Typical Values:

Force Constant = 42 N/m

Resonance Frequency = 330 kHz,Cantilever Length = 125 µm

Cantilever Width = 30 µm

Quality Factor = 30,000

Packages of 10 probes

PPP-QFMR for Force Modulation Mode:

Typical Values:

Force constant = 2.8 N/m

Resonance frequency = 75 kHz