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High-Performance Nanoscale Metrology System

Imago® Scientific Instruments, in conjunction with its representatives based in Japan, the Noah Corporation, announced that they have delivered a LEAP® 3000 Metrology System to Tohoku University. Tohoku selected Imago due to its global leadership position in nanoscale metrology and the proven capability of Imago’s LEAP system. The Tohoku University system is the third system Imago has installed in Japan in the last six months.

The LEAP system analyzes materials by removing and examining individual atoms, enabling metrology at the atomic scale.

The LEAP analyzes materials by removing and examining individual atoms, enabling metrology at the atomic scale. The true power of the LEAP lies in its ability to tie compositional information to structure on the atomic scale, thereby allowing researchers to analyze the nanometer-scale properties of materials. The LEAP at Tohoku University is being used to analyze the effects of nuclear irradiation on materials.

“We are proud and honored to have been selected by Tohoku University Institute for Materials Research to provide Imago’s revolutionary metrology tool, which will enable a deeper understanding of the properties of irradiated materials,” said Noah CEO and President Hiroshi Tabira. Mr. Tabira added, “Imago’s LEAP 3000 Metrology System is the only instrument of its kind capable of providing the comprehensive, three-dimensional, micro-structural data required by the world-class Tohoku researchers to advance materials science.”

Visit www.imago.com.


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