New High-Q AFM Probe

NANOSENSORS™ (Neuchâtel, Switzerland,) has announced the Q30K-Plus, a novel scanning proximity probe with an outstanding Q-factor and an enhanced signal to noise ratio for UHV applications.

Based on the PointProbe® Plus AFM probe, the Q30K-Plus feature a Q-factor of over 30,000 (up to 50,000) under UHV conditions and a high reflectivity (even at wavelength of over 800 nm).

In addition to the enhanced Q-factor and an optimized signal to noise ratio, the series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7 nm.

The first product of the new Q30K-Plus line will be commercially available starting January 2006 in the following versions: PPP-QFMR and PPP-QNCHR. Other types for different operation modes and different tip shapes are being developed.

Visit www.nanosensors.com.